Direct deconvolution approach for depth profiling of element concentrations in multi-layered materials by confocal micro-beam X-ray fluorescence spectrometry-Reference-Cited by-同舟云学术

Direct deconvolution approach for depth profiling of element concentrations in multi-layered materials by confocal micro-beam X-ray fluorescence spectrometry

Published:2013-09 Issue: Volume:113 Page:62-67
ISSN:0039-9140
Container-title:Talanta
language:en
Short-container-title:Talanta

Author:

Wrobel Pawel,Czyzycki Mateusz

Publisher

Elsevier BV

Subject

Analytical Chemistry

Reference24 articles.

1. Applications of x-ray and neutron capillary optics

2. Latest developments and opportunities for 3D analysis of biological samples by confocal μ-XRF

3. A new 3D micro X-ray fluorescence analysis set-up – First archaeometric applications

4. Nondestructive elemental depth profiling of Japanese lacquerware ‘Tamamushi-nuri’ by confocal 3D-XRF analysis in comparison with micro GE-XRF

5. Confocal micro-X-ray fluorescence analysis as a new tool for the non-destructive study of the elemental distributions in pharmaceutical tablets

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