Surface oxidation of copper observed by perturbed angular correlation and Rutherford backscattering
Author:
Publisher
Elsevier BV
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
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1. Enhancement of Oxidation Resistance and Electrical Properties of Indium-Doped Copper Thin Films;Journal of Electronic Materials;2008-02-21
2. Chemical and thermal reduction of thin films of copper (II) oxide and copper (I) oxide;Journal of Applied Physics;2001-10-15
3. Enhancement of oxidation resistance in Cu and Cu(Al) thin layers;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1999-01
4. Investigation of the mechanism responsible for the corrosion resistance of B implanted copper;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1994-03
5. Perturbed-angular-correlation experiments withIn111inMBa2Cu3O7−δ(M=Y,Yb): The Cu(1)-site puzzle;Physical Review B;1993-09-01
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