Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference15 articles.
1. Recent advancements in MCM-L imaging and via genaration by laser direct writing;Illyefalvi-Vitéz,1998
2. Silver migration in electrical insulation;Kohman;Bell System Technical Journal,1955
3. Migrated-gold resistive shorts in microcircuits;Shumka,1975
4. Metal Electromigration induced by solder flux residue in hybrid microcircuits;Benson;IEEE Trans. Comp., Hybrids, Manuf. Technol,1988
5. Silver migration in thick-film conductors and chip attachment resins;Coleman;Microelectronics Journal,1981
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