Logarithmic distributions in reliability analysis-Reference-Cited by-同舟云学术

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Logarithmic distributions in reliability analysis

Published:2002-04 Issue:4-5 Volume:42 Page:779-786
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Jones B.K.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference36 articles.

1. Proceedings of International Conference on Unsolved Problems of Noise and Fluctuations (UPON), Adelaide, 1999;Jones,2000

2. Resource letter: ScL-1: scaling laws;Wiesenfeld;Am J Phys,2001

3. Fractals, chaos, power laws;Schroeder,1992

4. Pareto V. Cours d'economie politique. Lausanne, 1897

5. Human behaviour and the principle of least effort;Zipf,1949

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1. Estimation on Reliability Models of Bearing Failure Data;Mathematical Problems in Engineering;2018

2. It's about Space, It's about Time, Neuroeconomics and the Brain Sublime;Journal of Economic Perspectives;2011-11-01

3. Investigation of the Device Degradation Mechanism in Pentacene-Based Thin-Film Transistors Using Low-Frequency-Noise Spectroscopy;IEEE Transactions on Electron Devices;2010-02

4. Dispersion of response times reveals cognitive dynamics.;Psychological Review;2009

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