Diffusion and absorption of corrosive gases in electronic encapsulants-Reference-Cited by-同舟云学术

Diffusion and absorption of corrosive gases in electronic encapsulants

Published:2003-04 Issue:4 Volume:43 Page:635-643
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Hillman C,Castillo B,Pecht M

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference45 articles.

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4. Fowler A, McCluskey P, Rogers K. Long term storage reliability of plastic encapsulated microcircuits. In: Proceedings of 1995 Advanced Technology, Acquisition, Qualification, and Reliability Workshop, Newport Beach, CA, August 1995. p. 269–78

5. Long-term non-operating reliability of electronic products,1995

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