1. Pershenkov VS, Popov VD, Shal’nov AV. Surface Radiation Effects in Integrated Microcircuits. Moscow: Energoatomizdat, 1988. p. 255
2. Ma TP, Dressendorfer PV, editors. Ionizing Radiation Effects in MOS Devices and Circuits. New York: Wiley-Interscience, 1989. p. 650
3. Radiation effects in short-channel MIS-devices;Levin;Russian Microelectron,1992
4. Direct method for determination of the density of surface states from the charge pumping currents;Levin;Semiconductors,1993
5. Transient spectroscopy of surface states in a constant subthreshold current mode for MIS transistors;Levin;Tech Phys,1999