High reliability in PHEMT MMICs with dual-etch-stop AlAs layers for high-speed RF switch applications

Author:

Gao Frank

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference12 articles.

1. High-efficiency GaAs-based PHEMT C-band power amplifier;Brown;IEEE Microwave Guided Wave Lett.,1996

2. 5 mm high-power-density dual-delta-doped power HEMT’s for 3 V L-band applications;Lai;IEEE Electron Device Lett.,1996

3. Pavlidis D, HBT vs. PHEMT vs. MESFET: What’s the best and why. In: 1999 International Conference on GaAs Manufacturing Technology, Vancouver, Canada, April 1999. p. 157–60

4. The effects of buffer thickness on GaAs MESFET characteristics: channel–substrate current, drain breakdown, and reliability;Gao;Microelectron. Reliab.,2002

5. A new method for determining the FET small-signal equivalent circuit;Dambrine;IEEE Trans. Microwave Theory Tech.,1988

Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. GaAs pHEMT Single Pole Double Throw(SPDT) RF Switch Failure Analysis;2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA);2019-07

2. Performance of a GaAs-Based Pseudomorphic Transistor with the Electroless-Plated Surface Treated Gate;Journal of The Electrochemical Society;2010

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