Molecular beam epitaxy of silicon based electronic structures
Author:
Publisher
Elsevier BV
Subject
General Engineering
Reference23 articles.
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4. Organisationen als konfliktäre Systeme;Strukturinduzierte Kommunikationskonflikte in Organisationen;1996
5. Characterization of surfactant introduction into germanium-rich Si1−x Gex molecular beam epitaxy layer growth on silicon by means of secondary-ion mass spectrometry and Auger electron spectroscopy;Thin Solid Films;1992-12
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