Funder
National Research Foundation of Korea
Ministry of Science, ICT and Future Planning
Reference35 articles.
1. Clustering high dimensional data;Assent;Wiley Interdisciplinary Reviews: Data Mining and Knowledge Discovery,2012
2. Supervised contrastive learning for wafer map pattern classification;Bae;Engineering Applications of Artificial Intelligence,2023
3. Wafer classification using support vector machines;Baly;IEEE Transactions on Semiconductor Manufacturing,2012
4. A systematic review of deep learning for silicon wafer defect recognition;Batool;IEEE Access,2021
5. Active learning for data streams: A survey;Cacciarelli;Machine Learning,2024