Pragmatic structure optimization: Achieving optimal crosstalk delay and gate oxide reliability of randomly mixed CNT bundle interconnects-Reference-Cited by-同舟云学术

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Pragmatic structure optimization: Achieving optimal crosstalk delay and gate oxide reliability of randomly mixed CNT bundle interconnects

Published:2024-11 Issue: Volume:195 Page:207983
ISSN:2773-0123
Container-title:Micro and Nanostructures
language:en
Short-container-title:Micro and Nanostructures

Author:

Sharma Ritika^ORCID,Rai Mayank Kumar,Khanna Rajesh

Publisher

Elsevier BV

Reference47 articles.

1. Comprehensive study of the resistivity of copper wires with lateral dimensions of 100 nm and smaller;Steinhögl;J. Appl. Phys.,2005

2. On-chip interconnect conductor materials for end-of-roadmap technology nodes;Vyas;IEEE Trans. Nanotechnol.,2018

3. Resistance of copper nanowires and comparison with carbon nanotube bundles for interconnect applications using first principles calculations;Zhou;J. Phys. Condens. Matter,2008

4. Reliability and current carrying capacity of carbon nanotubes;Wei;Appl. Phys. Lett.,2001

5. Strength and breaking mechanism of multiwalled carbon nanotubes under tensile load;Yu;Science (80),2000

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