Effect of the contact area on the electrical characteristics of the Ti/6H–SiC (n) Schottky diode

Author:

Bekaddour Abderrahmane,Rabehi AbdelazizORCID,Tizi Schahrazade,Zebentout Baya,Akkal Boudali,Benamara Zineb

Publisher

Elsevier BV

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials,Biomaterials

Reference40 articles.

1. Current–voltage, capacitance–voltage–temperature, and DLTS studies of Ni| 6H-SiC Schottky diode;Rabehi;Semiconductors,2021

2. The reverse bias current–voltage–temperature (I–V–T) characteristics of the (Au/Ti)/Al2O3/n-GaAs Schottky barrier diodes (SBDs) in temperature range of 80–380 K;Güçlü;J. Mater. Sci. Mater. Electron.,2021

3. Discrepancies in barrier heights obtained from current–voltage (IV) and capacitance–voltage (CV) of Au/PNoMPhPPy/n-GaAs structures in wide range of temperature;Altındal;J. Mater. Sci. Mater. Electron.,2022

4. "An Investigation on Barrier Inhomogeneities of 4H-SiC Schottky Barrier Diodes Induced by Surface Morphology and traps.";Lee,2012

5. Advancing Silicon Carbide Electronics Technology I: Metal Contacts to Silicon Carbide: Physics, Technology, Applications,2018

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