Interferometry for ellipso-height-topometry
Author:
Publisher
Elsevier BV
Subject
Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference6 articles.
1. Topometry for locally changing materials;Leonhardt;Opt. Lett.,1998
2. Ellipso-height topometry;Leonhardt;Optik,2001
3. Interferometry for ellipso-height-topometry, part 1;Leonhardt;Optik,2003
4. Principles of Optics;Born,1970
5. Optical topometry of surfaces with locally changing materials;Leonhardt;J. Mod. Opt.,1999
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