Studies on surface deformation of copper sulphide thin films by holographic interferometry technique
Author:
Publisher
Elsevier BV
Subject
Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference11 articles.
1. Real-time holographic interferometry in a physical experiment;Gurevich;J. Opt. Technol.,1996
2. Studies on electrodeposited silver selenide thin film by double exposure holographic interferometry;Pawar;Mater. Sci. Eng. B,2007
3. Growth of CuS thin films by the successive ionic layer adsorption and reaction method;Lindroos;Appl. Surf. Sci.,2000
4. Proceedings of the 10th IEEE Photovoltic Specialist Conference, IEEE;Plaz,1973
5. Modified chemical deposition and physico-chemical properties of copper sulphide (Cu2S) thin films;Pathan;Appl. Surf. Sci.,2002
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