Interferometry for Ellipso-Height-Topometry part 3: Correction of the aspect errors and reduction of the dispersion of the ellipsometric parameters-Reference-Cited by-同舟云学术

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Interferometry for Ellipso-Height-Topometry part 3: Correction of the aspect errors and reduction of the dispersion of the ellipsometric parameters

Published:2014-09 Issue:18 Volume:125 Page:5286-5294
ISSN:0030-4026
Container-title:Optik
language:en
Short-container-title:Optik

Author:

Leonhardt K.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference10 articles.

1. Interferometry for ellipso-height-topometry. Part 2;Leonhardt;Optik,2010

2. Optische Interferenzen;Leonhardt,1981

3. Handbook of Ellipsometry,2005

4. Interferometry for Ellipso-Height-Topometry. Part 1;Leonhardt;Optik,2003

5. Handbook of Optical Constants of Solids II;Borghesi,1991

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