Hard X-ray Photoelectron Spectroscopy (HAXPES) characterisation of electrochemical passivation oxide layers on Al–Cr–Fe complex metallic alloys (CMAs)-Reference-Cited by-同舟云学术

Hard X-ray Photoelectron Spectroscopy (HAXPES) characterisation of electrochemical passivation oxide layers on Al–Cr–Fe complex metallic alloys (CMAs)

Published:2014-09 Issue: Volume:46 Page:13-17
ISSN:1388-2481
Container-title:Electrochemistry Communications
language:en
Short-container-title:Electrochemistry Communications

Author:

Beni Alessandra,Ott Noémie,Pawelkiewicz Magdalena,Wardé Micheline,Young Kirsty,Bauer Birgitta,Rajput Parasmani,Detlefs Blanka,Zegenhagen Jörg,McGrath Ronan,Barthés-Labrousse Marie-Geneviève,Jeurgens Lars P.H.,Schmutz Patrik

Publisher

Elsevier BV

Subject

Electrochemistry

Reference17 articles.

1. Useful Quasicrystals;Dubois,2005

2. Real space crystallography of a complex metallic alloy: high-angle annular dark-field scanning transmission electron microscopy of o-Al4(Cr,Fe)

3. Origin of anisotropic nonmetallic transport in theAl80Cr15Fe5decagonal approximant

4. Passivation of Al–Cr–Fe and Al–Cu–Fe–Cr complex metallic alloys in 1M H2SO4 and 1M NaOH solutions

5. Passivation and localised corrosion susceptibility of new Al–Cr–Fe complex metallic alloys in acidic NaCl electrolytes

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