Subject
Cell Biology,Structural Biology,General Physics and Astronomy,General Materials Science
Reference38 articles.
1. Specific effects and deconvolution in submicrometre EPMA: application to binary diffusion;Arnould;X-ray Spectrom.,2003
2. Pressure and scattering regime influence on the EDS profile resolution at a composite interface in environmental SEM;Arnoult;Micron,2011
3. High-spatial-resolution low-energy electron beam X-ray microanalysis;Barkshire;Mikrochim. Acta,2000
4. Bilde-Sorenson, J., Appel, C.C., 1997. X-ray spectrometry in ESEM and LVSEM: corrections for Beam Skirt Effects. In: Tholen, A.R., Svenski Tryck, I. (Eds.), Abstracts of 49th Meeting of the Scandinavian Society for Electron Microscopy and Microanalysis. Goteborg, Sweden.
5. An empirical approach to K-shell ionisation cross section by electrons;Casnati;J. Phys. B: At. Mol. Phys.,1982
Cited by
5 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献