Subject
Cell Biology,Structural Biology,General Physics and Astronomy,General Materials Science
Reference19 articles.
1. Characterisation of damage in ion implanted Ge;Appleton;Appl. Phys. Lett.,1982
2. FIB Workstation User's Guide, 1996.
3. Ion implantation damage and annealing in germanium;Holland;J. Appl. Phys.,1983
4. Cross-sectional transmission electron microscopy of precisely selected regions from semiconductor devices;Kirk;Inst. Phys. Conf. Ser.,1989
5. Transmission electron microscopy of semiconductor based products;Mardinly;Mater. Res. Soc. Symp. Proc.,1998
Cited by
25 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献