Circuit technique for semiconductor-device analysis with junction diode open circuit voltage decay example
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference51 articles.
1. The equivalent circuit model in solid-state electronics—Part I: The single energy level defect centers
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4. Determination of silicon power diode recombination parameters by combining open circuit voltage decay and storage time-reverse recovery data;Solid-State Electronics;1991-07
5. Application of open circuit voltage decay to the characterisation of heavy doping parameters in a p+ emitter of a junction diode;Solid-State Electronics;1990-07
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