Low frequency noise and DLTS as semiconductor device characterization tools-Reference-Cited by-同舟云学术

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Low frequency noise and DLTS as semiconductor device characterization tools

Published:1988-02 Issue:2 Volume:31 Page:205-217
ISSN:0038-1101
Container-title:Solid-State Electronics
language:en
Short-container-title:Solid-State Electronics

Author:

Scholz F.,Hwang J.M.,Schroder D.K.

Publisher

Elsevier BV

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference7 articles.

1. The Use of Charge Pumping in the Correlation of Surface State Density and Noise;Thomas;Northern Telecom Report,1986

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