Reliability of Miniaturized Transistors from the Perspective of Single-Defects

Abstract

To analyze the reliability of semiconductor transistors, changes in the performance of the devices during operation are evaluated. A prominent effect altering the device behavior are the so called bias temperature instabilities (BTI), which emerge as a drift of the device threshold voltage over time. With ongoing miniaturization of the transistors towards a few tens of nanometer small devices the drift of the threshold voltage is observed to proceed in discrete steps. Quite interestingly, each of these steps correspond to charge capture or charge emission event of a certain defect in the atomic structure of the device. This observation paves the way for studying device reliability issues like BTI at the single-defect level. By considering single-defects the physical mechanism of charge trapping can be investigated very detailed. An in-depth understanding of the intricate charge trapping kinetics of the defects is essential for modeling of the device behavior and also for accurate estimation of the device lifetime amongst others. In this article the recent advancements in characterization, analysis and modeling of single-defects are reviewed.