On the analysis of pulsed MOS capacitance measurement
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference5 articles.
1. On the determination of minority carrier lifetime from the transient response of an MOS capacitor
2. Physics and Technology of Semiconductor Devices;Grove,1967
3. Exact modeling of the transient response of an MOS capacitor
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