A comparison study of Pd/In/Pd, Pd-In/Pd, and PdIn ohmic contacts to n-GaAs
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference18 articles.
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5. Non‐alloyed ohmic contact ton‐GaAs by solid phase epitaxy
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1. Phase formation and reaction kinetics in M- In systems (M = Pt, Pd, Mn);INT J MATER RES;2022
2. IR-VIS-UV ellipsometry, XRD and AES investigation of In/Cu and In/Pd thin films;physica status solidi (c);2008-05
3. Characterization of In/Pd and Pd/In/Pd thin films by ellipsometric, XRD and AES methods;Applied Surface Science;2007-01
4. Phase formation and diffusion soldering in Pt/In, Pd/In, and Zr/Sn thin-film systems;Journal of Electronic Materials;2003-02
5. Study of Pd–In interaction during Pd deposition on pyrolytically prepared In2O3;Applied Surface Science;2003-01
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