Elastic strains in quantum dots studied by high resolution X-ray diffraction-Reference-Cited by-同舟云学术

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Elastic strains in quantum dots studied by high resolution X-ray diffraction

Published:1996-01 Issue:1-8 Volume:40 Page:373-377
ISSN:0038-1101
Container-title:Solid-State Electronics
language:en
Short-container-title:Solid-State Electronics

Author:

Holy V,Darhuber A.A,Bauer G,Wang P.D,Song Y.P,Sotomayor Torres C.M,Holland M.C

Publisher

Elsevier BV

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference12 articles.

1. Intrinsic mechanism for the poor luminescence properties of quantum-box systems

2. Elastic lattice deformation in quantum-wire heterostructures

3. X-ray Bragg diffraction on periodic surface gratings

4. X-ray diffraction from corrugated crystalline surfaces and interfaces

5. Triple crystal x‐ray diffractometry of periodic arrays of semiconductor quantum wires

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. High-resolution X-ray diffraction in crystalline structures with quantum dots;Physics-Uspekhi;2015-05-31

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