noise in MOSFET as a diagnostic tool
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference17 articles.
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1. Experimental and modeling study of 1/f noise in multilayer MoS2 and MoSe2 field-effect transistors;Journal of Applied Physics;2020-09-07
2. Assessment of DC and low-frequency noise performances of triple-gate FinFETs at cryogenic temperatures;Semiconductor Science and Technology;2016-11-11
3. Study of Hot-Carrier-Induced Traps in Nanoscale UTBB FD-SOI MOSFETs by Low-Frequency Noise Measurements;IEEE Transactions on Electron Devices;2016
4. Identification of Si film traps in p-channel SOI FinFETs using low temperature noise spectroscopy;Solid-State Electronics;2015-10
5. A novel approach to investigate bulk carrier lifetime using low frequency fluctuation noise measurement;Semiconductor Science and Technology;2014-10-28
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