Effect of Ge incorporation on the performance of p-channel polycrystalline Si1−xGex thin-film transistors
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference27 articles.
1. Rapid thermal chemical vapor deposition of in-situ boron doped polycrystalline SIxGe1-x
2. Deposition and device application ofinsituboron‐doped polycrystalline SiGe films grown at low temperatures
3. Fabrication ofp‐channel polycrystalline Si1−xGexthin‐film transistors by ultrahigh vacuum chemical vapor deposition
4. A variable-work-function polycrystalline-Si/sub 1-x/Ge/sub x/ gate material for submicrometer CMOS technologies
Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Performance evaluation of polycrystalline Si1−xGex thin-film transistors fabricated by continuous-wave laser lateral crystallization on glass substrates;Japanese Journal of Applied Physics;2024-06-03
2. Grain Size Engineering Using Amorphous-Ge/Si Stack to Enhance Channel Mobility for NAND Flash Memory;IEEE Transactions on Electron Devices;2022-10
3. Channel Mobility Boosting in a Poly-Si Channel Using Ge Diffusion Engineering and Hydrogen Plasma Treatment;IEEE Electron Device Letters;2022-03
4. Leakage Current Reduction Techniques in Poly-Si TFTs for Active Matrix Liquid Crystal Displays: A Comprehensive Study;IEEE Transactions on Device and Materials Reliability;2006-06
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