Analytical expressions for tunnel currents in metal-insulator-metal (MIM) and metal-insulator-semiconductor (MIS) structures in a two-band model
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference12 articles.
1. Tunneling Phenomena in Solids;Stratton,1969
2. Effect of band structure on the voltage-current characteristics of metal-insulator-metal tunnel junctions
3. Generalized Formula for the Electric Tunnel Effect between Similar Electrodes Separated by a Thin Insulating Film
4. Direct Interelectrode Tunneling in GaSe
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2. Transient currents in pulsed metal–oxide–semiconductor tunnel diodes;Journal of Applied Physics;1998-07
3. A quantitative approach to the effects of surface topography on tunnelling current between two large rough metal bodies;Journal of Physics: Condensed Matter;1991-06-24
4. Trap-Assisted Tunneling in MIS and Schottky Structures;Physica Status Solidi (a);1983-09-16
5. Electron Tunneling Theory and Non-Linear Transport in Junctions and Microstructures;Quantum Metrology and Fundamental Physical Constants;1983
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