Some consequences of spatial correlation on noise calculations
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference11 articles.
1. Thermal noise in space-charge-limited diodes
2. Noise in space-charge-limited solid-state devices
3. H.F. thermal noise in space-charge-limited solid-state diodes
4. Generation-recombination noise in double-injection diodes
5. G-R noise experiments in double-injection silicon diodes operating in the semiconductor regime
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1. Transfer-field methods for electronic noise in submicron semiconductor structures;La Rivista del Nuovo Cimento;2001-09
2. Physical origin of the excess thermal noise in short channel MOSFETs;IEEE Electron Device Letters;2001-02
3. Noise in Submicron Devices;Physics of Submicron Devices;1991
4. Noise and diffusion of hot holes in Si;Solid-State Electronics;1978-01
5. Scattering noise of hot holes in space‐charge‐limited current flow inp‐type Si;Journal of Applied Physics;1976-06
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