Proof of basic semiconductor flicker noise formulae
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference2 articles.
1. 1/ƒ noise is no surface effect
2. Characterization of low 1/f noise in MOS transistors
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1. Low-frequency noise in InAs films bonded on low-k flexible substrates;Applied Physics Letters;2015-11-09
2. Current‐noise‐power spectra of amorphous silicon thin‐film transistors;Journal of Applied Physics;1994-08-15
3. Size effect on the electrical conduction and noise of RuO2-based thick film resistors;Journal of Electronic Materials;1992-12
4. On the origin of 1/ƒ noise;International Journal of Electronics;1988-10
5. Determination of Si-SiO/sub 2/ interface trap density by 1/f noise measurements;IEEE Transactions on Electron Devices;1988-10
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