Author:
Sanii F.,Giles F.P.,Schwartz R.J.,Gray J.L.
Subject
Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference5 articles.
1. Proc. 13th IEEE Photo. Spec. Conf.;Schwartz,1978
2. Proc. Symp. Diagnostic Techniques for Semiconductor Materials and Devices;Yablonovitch,1988
3. Semiconductor Measurements and Instrumentation;Runyan,1975
4. Ph.D. Thesis;Sanii,1988
5. Contactless optical evaluation of processing effects on carrier lifetime in silicon
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