1. Hydrogen-induced surface space-charge regions in oxide-protected silicon
2. E. Kooi and M.V. Whelan, “On the Role of Sodium and Hydrogen in the SiSiO2 System”, to be published
3. Environmental Conditions for the Thermal Growth of Sodium-Free SiO2 Layers;Schmidt;Abstract No. 11,1966
4. DENSITY OF SiO2–Si INTERFACE STATES
5. A Contamination Induced Charge, Thermal Oxides on Silicon;Sunshine;paper presented at Physics of Failure Conference,1966