Lifetime determination in p/n junction diodes and solar cells from open-circuit-voltage decay including junction capacitance effects
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference12 articles.
1. Post-Injection Barrier Electromotive Force ofp−nJunctions
2. Depletion layer effects in the open-circuit- voltage-decay lifetime measurement
3. Minority carrier lifetimes using compensated differental open circuit voltage decay
4. Determination of effective surface recombination velocity and minority‐carrier lifetime in high‐efficiency Si solar cells
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2. Revisiting lifetimes from transient electrical characterization of thin film solar cells; a capacitive concern evaluated for silicon, organic and perovskite devices;Energy & Environmental Science;2018
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5. Transient analysis of diode switching circuits including charge storage effect;IEEE Transactions on Circuits and Systems I: Fundamental Theory and Applications;1996-03
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