Analysis and modeling of self-heating effects in thin-film SOI MOSFETs as a function of temperature-Reference-Cited by-同舟云学术

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Analysis and modeling of self-heating effects in thin-film SOI MOSFETs as a function of temperature

Published:1995-03 Issue:3 Volume:38 Page:615-618
ISSN:0038-1101
Container-title:Solid-State Electronics
language:en
Short-container-title:Solid-State Electronics

Author:

Jomaah J.,Ghibaudo G.,Balestra F.

Publisher

Elsevier BV

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference7 articles.

1. Physical origin of negative differential resistance in SOI transistors

2. Estimation of heat transfer in SOI-MOSFETs

3. Analytical Device Model of SOI MOSFETs Including Self-Heating Effect

4. Direct extraction of MOSFET dynamic thermal characteristics from standard transistor structures using small signal measurements

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