Excess noise sources due to defects in forward biased junctions
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference24 articles.
1. Noise due to generation and recombination of carriers in p-n junction transition regions
2. Noise and admittance of the generation—Recombination current involving SRH centers in the space-charge region of junction devices
3. Physical interpretation of the noise reduction for the generation—Recombination current due to SRH centers in the space-charge layer
4. Noise associated with recombination in the emitter space charge region of transistors
5. Physics and Technology of Semiconductor Devices;Grove,1967
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