Noise in Ru-based thick-film resistors-Reference-Cited by-同舟云学术

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Noise in Ru-based thick-film resistors

Published:1982-08 Issue:8 Volume:25 Page:821-827
ISSN:0038-1101
Container-title:Solid-State Electronics
language:en
Short-container-title:Solid-State Electronics

Author:

Chen T.M.,Su S.F.,Smith D.

Publisher

Elsevier BV

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference16 articles.

1. Conduction Mechanisms in Thick Film Microcircuits;Vest;Final Technical Report, ARPA Order No. 1642,1975

2. Electrical properties and conduction mechanisms of Ru‐based thick‐film (cermet) resistors

3. Proc. ISHM Hybrid Microelect. Symp.;Kuo,1968

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1. Review on Excess Noise Measurements of Resistors;Sensors;2023-01-18

2. Noise sources in polymer thick-film resistors;Soldering & Surface Mount Technology;2015-06-01

3. NOISE SPECTROSCOPY OF RESISTIVE COMPONENTS AT ELEVATED TEMPERATURE;Metrology and Measurement Systems;2014-03-01

4. Fluctuating phenomena in resistive materials and devices;SPIE Proceedings;2013-07-25

5. Noise and switching phenomena in thick-film resistors;Journal of Physics D: Applied Physics;2007-12-21

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