Noise and switching phenomena in thick-film resistors-Reference-Cited by-同舟云学术

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Noise and switching phenomena in thick-film resistors

Published:2007-12-21 Issue:2 Volume:41 Page:025303
ISSN:0022-3727
Container-title:Journal of Physics D: Applied Physics
language:
Short-container-title:J. Phys. D: Appl. Phys.

Author:

Kolek A,Stadler A W,Zawiślak Z,Mleczko K,Dziedzic A

Publisher

IOP Publishing

Subject

Surfaces, Coatings and Films,Acoustics and Ultrasonics,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://stacks.iop.org/0022-3727/41/i=2/a=025303/pdf

Reference32 articles.

1. Criteria of Low-Noise Thick-Film Resistors

2. Noise as a diagnostic tool for quality and reliability of electronic devices

3. Energy Scales for Noise Processes in Metals

4. Resistance relaxation in carbon and RuO2 based thermometers

Cited by 7 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Aging in Commercial Thick- and Thin-Film Resistors: Survey and Uncertainty Analysis;IEEE Transactions on Instrumentation and Measurement;2019-11

2. Noise Measurements Of Resistors With The Use Of Dual-Phase Virtual Lock-In Technique;Metrology and Measurement Systems;2015-12-01

3. NOISE SPECTROSCOPY OF RESISTIVE COMPONENTS AT ELEVATED TEMPERATURE;Metrology and Measurement Systems;2014-03-01

4. Fluctuating phenomena in resistive materials and devices;SPIE Proceedings;2013-07-25

5. Noise properties of thick-film resistors in extended temperature range;Microelectronics Reliability;2011-07

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