Determination of Si-metal work function differences by MOS capacitance technique
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference21 articles.
1. Physics of Semiconductor Devices;Sze,1969
2. Physics and Technology of Semiconductor Device;Grove,1967
3. Photoemissive Materials;Sommer,1968
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