Data of automated optical inspection of surface-mounted technology electronic production

Author:

Pfab KorbinianORCID,Eichler Roman,Mallandur Adarsh,Rothering Marcel

Funder

Helsingin Yliopisto

Publisher

Elsevier BV

Reference9 articles.

1. A machine learning based approach to detect false calls in SMT manufacturing;Thielen,2020

2. Improving the Performance of Automated Optical Inspection (AOI) Using Machine Learning Classifiers;Reshadat,2021

3. E. Jabbar, P. Besse, J.M. Loubes, N.B. Roa, C. Merle, R. Dettai, Supervised learning approach for surface-mount device production, 2019.

4. R. H. J. Steeghs, Using machine learning to reduce the false call problem in electronics manufacturing, 29 Oct 2021 https://research.tue.nl/en/studentTheses/using-machine-learning-to-reduce-the-false-call-problem-in-electr.

5. K. Pfab, FCR_dataset, 2023, GitLab repository, https://gitlab.com/research9841542/fcr_dataset.

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