Contactless detection of optical induced current in microelectronic devices by capacitive coupling

Author:

Bergner H.,Hempel K.,Sargsjan G.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference3 articles.

Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Electric Force Microscope, Capacitive Coupling, and Scanning Magnetoresistive Probe;Contactless VLSI Measurement and Testing Techniques;2017-11-17

2. Comparison of Contactless Testing Methodologies;Contactless VLSI Measurement and Testing Techniques;2017-11-17

3. Application of lateral photovoltage towards contactless light beam induced current measurements and its dependence on the finite beam size;Review of Scientific Instruments;2014-07

4. Contactless Testing and Diagnosis Techniques;Advanced Circuits for Emerging Technologies;2012-05-07

5. Comparison of Contactless Measurement and Testing Techniques to a New All-Silicon Optical Test and Characterization Method;IEEE Transactions on Instrumentation and Measurement;2005-10

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