1. Liquid metal sources in ion microscopy and secondary ion mass spectrometry;Mair,1985
2. On-line digital computer techniques in electron microscopy: general introduction;Smith;Journ. of Microscopy,1982
3. Cleaver, J.R.A., Ahmed, H., Heard, P.J., Prewett, P.D., Dunn G.J., Kaufmann, H. Focused ion beam repair techniques for clear and opaque defects in masks. (These Proceedings).
4. Barth, J.E., Gruyter, C.B. de, Kruit, P., Leeden, P.E. van der, Le Poole J.B., Mast, K.D. van der. Gas ion source for focused beams. (These proceedings).
5. H2 and rare gas field ion source with high angular current;Hanson;J. Vac. Sci. Technol.,1979