A diagnostic assistant for integrated circuit diagnosis

Author:

Noble Alan C.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference15 articles.

1. E-Beam Probing for VLSI Circuit Debug;Richardson;VLSI Systems Design,1987

2. Workstation Driven E-Beam Prober;Concina,1987

3. M. Engelhardt, “Design and Characteristics of a Lens Spectrometer with Electrostatic Extraction for Election Beam Probing,” 3rd European Conference on Electron and Optical Beam Testing of Integrated Circuits.

4. New Approach to Integrate LSI Design Databases with E-beam Tester;Hu,1990

5. D. Savart, B. Courtois, “Automatic Failure Analysis of VLSI Circuits Using an E-beam,” 1st European Conference on Electron and Optical Beam Testing of Integrated Circuits (Preprints) pp. 127–134.

Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Automatic measurement with an electron beam tester;Microelectronic Engineering;1993-04

2. Principles and Applications;Electron Beam Testing Technology;1993

3. Introduction;Electron Beam Testing Technology;1993

4. System Integration;Electron Beam Testing Technology;1993

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