Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference13 articles.
1. E-B tester: a tool for VLSI components analysis;Bourgeon;The Mic. Eng. J.,1987
2. Failure analysis using E-B;Collin;The Mi. Eng. J.,1990
3. IDS 5000: an integrated diagnostic system for VLSI;Concina;The Mic. Eng. J.,1987
4. Workstation-driven E-B prober;Concina;IEEE ITC,1987
5. Integration of CAD, CAT and E-B testing for IC-internal logic verification;Gorlich;IEEE ITC,1987
Cited by
3 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. The role of internal waveform measurements in IC development;Microelectronic Engineering;1994-03
2. REFERENCES;Handbook of VLSI Chip Design and Expert Systems;1993
3. System Integration;Electron Beam Testing Technology;1993