IDS 5000: An integrated diagnostic system for VLSI-Reference-Cited by-同舟云学术

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IDS 5000: An integrated diagnostic system for VLSI

Published:1987-01 Issue:2-4 Volume:7 Page:339-342
ISSN:0167-9317
Container-title:Microelectronic Engineering
language:en
Short-container-title:Microelectronic Engineering

Author:

Concina Stefano,Richardson Neil

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference5 articles.

1. E-Beam Probing for VLSI Circuit Debug;Richardson;VLSI systems design,1987

2. An Improved Magnetic-Collimating Secondary Electron Energy Filter for VLSI Diagnostics;Richardson,1987

3. Software integration in a workstation-based E-Beam tester;Concina,1986

4. CADDIF data interchange format;Tinaztepe,1987

5. Dynamic fault imaging of VLSI random logic devices;May,1984

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2. Pulsed electron beam generation via laser stimulation;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;1995-09

3. Electron Spectrometers and Voltage Measurements;Electron Beam Testing Technology;1993

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