Author:
May D.,Pierrel J.P.,Primot L.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference12 articles.
1. Dynamic fault imaging of VLSI random logic devices;May;IEEE/IRPS,1984
2. Failure Analysis Using E-Beam;Collin;Microelectronic Engineering,1990
3. Towards automatic diagnostic: E-Beam tester database environment;May;ETC,1991
4. High precision electron beam positioning using computer image analysis for electron beam testing;Michener;Microelectronic Engineering,1987
5. A class of algorithms for fast digital image registration;Barnea;IEEE Transactions on Computer,1972
Cited by
1 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献