Evaluation of an advanced submicron X-ray stepper (XRS 200): Pattern transfer and alignment accuracy

Author:

Simon K.,Gabeli F.,Rohrmoser W.,Seedorf S.,Scheunemann H.-U.,Huber H.L.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference7 articles.

1. An X-ray stepper;Cullmann;SPIE,1983

2. Application of X-ray steppers using optical alignment for synchrotron based X-ray lithography;Huber;Microelectronic Eng.,1988

3. An X-ray stepper for production lithography;Cullmann;SPIE,1989

4. A. Flamholz, R. Rippstein; X-ray stepper exposure system performance and status, Proceeding of the EIPB '90, San Antonio, Texas, to be published

5. K.A. Cooper, Steppers for X-ray microlithography, Microlithography Workshop Campinas Brazil 89

Cited by 3 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. X-ray mask development based on SiC membrane and W absorber;Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures;1992-11

2. Overlay performance of an advanced x-ray stepper (XRS 200);Microelectronic Engineering;1992-03

3. E-beam written optically transparent x-ray masks: Four levels for an industrial VLSI chip with megabit design rules;Microelectronic Engineering;1992-03

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