Modeling and simulation of the lateral photovoltage scanning method-Reference-Cited by-同舟云学术

Modeling and simulation of the lateral photovoltage scanning method

Published:2021-11 Issue: Volume:102 Page:248-260
ISSN:0898-1221
Container-title:Computers & Mathematics with Applications
language:en
Short-container-title:Computers & Mathematics with Applications

Author:

Farrell Patricio^ORCID,Kayser Stefan,Rotundo Nella

Funder

DFG

Publisher

Elsevier BV

Subject

Computational Mathematics,Computational Theory and Mathematics,Modeling and Simulation

Reference30 articles.

1. The theory of a bulk photo-voltaic phenomenon in semi-conductors;Tauc;Czechoslov. J. Phys.,1955

2. The lateral photovoltage scanning method to probe spatial inhomogeneities in semiconductors: a joined numerical and experimental investigation;Kayser,2020

3. Resistivity measurements on germanium for transistor;Valdes;Proc. IRE,1954

4. Four-Point Probe User Manual 3.0c;Ossila,2019

5. A spreading resistance technique for resistivity measurements on silicon;Mazur;J. Electrochem. Soc.,1966

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Forward lateral photovoltage scanning problem: Perturbation approach and existence-uniqueness analysis;Journal of Mathematical Analysis and Applications;2025-01

2. An energy‐based finite‐strain model for 3D heterostructured materials and its validation by curvature analysis;International Journal for Numerical Methods in Engineering;2024-06-19

3. Data-driven solutions of ill-posed inverse problems arising from doping reconstruction in semiconductors;Applied Mathematics in Science and Engineering;2024-03-22

4. Data-driven doping reconstruction;2022 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD);2022-09-12

5. Ultrafast Deep-Ultraviolet Laser-Induced Voltage Response of Pyrite;Micromachines;2021-12-13