Forward lateral photovoltage scanning problem: Perturbation approach and existence-uniqueness analysis

Author:

Alì Giuseppe,Farrell Patricio,Rotundo NellaORCID

Publisher

Elsevier BV

Reference25 articles.

1. Assessing the quality of the excess chemical potential flux scheme for degenerate semiconductor device simulation;Abdel;Opt. Quantum Electron.,2021

2. Elliptic partial differential-algebraic multiphysics models in electrical network design;Alì;Math. Models Methods Appl. Sci.,2003

3. An existence result for elliptic partial differential–algebraic equations arising in semiconductor modeling;Alìand;Nonlinear Anal., Theory Methods Appl.,2010

4. Spatial mapping of electrically active defects in HgCdTe using laser beam-induced current;Bajaj;J. Vac. Sci. Technol., A, Vac. Surf. Films,1987

5. Modeling and analysis of laser-beam-induced current images in semiconductors;Busenberg;SIAM J. Appl. Math.,1993

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