Optimization of NBED simulations for disc-detection measurements-Reference-Cited by-同舟云学术

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Optimization of NBED simulations for disc-detection measurements

Published:2017-10 Issue: Volume:181 Page:50-60
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Grieb Tim,Krause Florian F.,Mahr Christoph,Zillmann Dennis,Müller-Caspary Knut,Schowalter Marco,Rosenauer Andreas

Funder

German Research Foundation

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference32 articles.

1. Improved precision in strain measurement using nanobeam electron diffraction;Béché;Appl. Phys. Lett.,2009

2. Evaluation of two-dimensional strain distribution by STEM/NBD;Uesugi;Ultramicroscopy,2011

3. Strain measurement in semiconductor heterostructures by scanning transmission electron microscopy;Müller;Microsc. Microanal.,2012

4. Strain measurement at the nanoscale: comparison between convergent beam electron diffraction, nano-beam electron diffraction, high resolution imaging and dark field electron holography;Béché;Ultramicroscopy,2013

5. Direct measurement of polarization-induced fields in GaN/AIN by nano-beam electron diffraction;Carvalho;Sci. Rep.,2016

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1. Contribution of multiple plasmon scattering in low-angle electron diffraction investigated by energy-filtered atomically resolved 4D-STEM;Applied Physics Letters;2022-11-21

2. Towards the interpretation of a shift of the central beam in nano-beam electron diffraction as a change in mean inner potential;Ultramicroscopy;2022-06

3. AutoDisk: Automated diffraction processing and strain mapping in 4D-STEM;Ultramicroscopy;2022-06

4. 4D-STEM at interfaces to GaN: Centre-of-mass approach & NBED-disc detection;Ultramicroscopy;2021-09

5. py4DSTEM: A Software Package for Four-Dimensional Scanning Transmission Electron Microscopy Data Analysis;Microscopy and Microanalysis;2021-05-21

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