Automatic correction of nonlinear damping effects in HAADF–STEM tomography for nanomaterials of discrete compositions-Reference-Cited by-同舟云学术

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Automatic correction of nonlinear damping effects in HAADF–STEM tomography for nanomaterials of discrete compositions

Published:2018-01 Issue: Volume:184 Page:57-65
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Zhong Zhichao,Aveyard Richard,Rieger Bernd,Bals Sara,Palenstijn Willem Jan,Batenburg K. Joost

Funder

Ministry of Economic Affairs

European Research Council

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference19 articles.

1. Z-Contrast tomography: a technique in three-dimensional nanostructural analysis based on Rutherford scattering;Midgley;Chem. Commun.,2001

2. Recent advances in electron tomography: TEM and HAADF–STEM tomography for materials science and semiconductor applications;Kübel;Microsc. Microanal.,2005

3. Principles of Computerized Tomographic Imaging;Kak,1988

4. 3D electron microscopy in the physical sciences: the development of Z-contrast and EFTEM tomography;Midgley;Ultramicroscopy,2003

5. Optimizing experimental parameters for the projection requirement in HAADF–STEM tomography;Aveyard;Ultramicroscopy,2017

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