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200 keV cold field emission source using carbon cone nanotip: Application to scanning transmission electron microscopy

  • Published:2017-11 Issue: Volume:182 Page:303-307
  • ISSN:0304-3991
  • Container-title:Ultramicroscopy
  • language:en
  • Short-container-title:Ultramicroscopy

Author:

Mamishin Shuichi,Kubo Yudai,Cours Robin,Monthioux Marc,Houdellier Florent

Funder

FEDER

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference29 articles.

1. Electron Gun Using a Field Emission Source

2. L.W. Swanson and G. A Schwind, Adv. Imaging Electr. Phys., Vol. 159.

3. Atom-by-atom structural and chemical analysis by annular dark-field electron microscopy

4. J.W. Butler, 6 Intern. Cong. Electron Microscopy, 191 (Kyoto, 1966).

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1. A LAB6 Nanoneedle Field-Emission Electron Source for Stable Imaging with Atomic Resolution in a Transmission Electron Microscope;2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC);2023-07-10

2. Breakdown of plane-wave-based theories of field emission from a subnanometer-radius tip;Applied Surface Science;2023-06

3. New probes based on carbon nano-cones for scanning probe microscopies;Ultramicroscopy;2023-03

4. Cold field emission electron source: From higher brightness to ultrafast beam;Coherent Electron Microscopy: Designing Faster and Brighter Electron Sources;2023

5. References;Coherent Electron Microscopy: Designing Faster and Brighter Electron Sources;2023
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