Precession electron diffraction: Observed and calculated intensities-Reference-Cited by-同舟云学术

Precession electron diffraction: Observed and calculated intensities

Published:2007-06 Issue:6-7 Volume:107 Page:523-533
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Oleynikov P.,Hovmöller S.,Zou X.D.

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference27 articles.

1. Double conical beam-rocking system for measurement of integrated electron diffraction intensities

2. Structure Model for the Phase AlmFe Derived from Three-Dimensional Electron Diffraction Intensity Data Collected by a Precession Technique. Comparison with Convergent-Beam Diffraction

3. Structure of Ti2P solved by three-dimensional electron diffraction data collected with the precession technique and high-resolution electron microscopy

4. On the integration of electron diffraction intensities in the Vincent–Midgley precession technique;Gjonnes;Ultramicroscopy,1997

5. Corrections for multiple scattering in integrated electron diffraction intensities;Gjonnes;Application to determination of structure factors in the [001] projection of AlmFe. Acta Crystallogr Section A,1998

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